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Accessories
KED has developed a range of SEM accessories designed to make your working day that little bit easier and thus more productive, such as the Probe Current Meter which facilitates accurate reproduction of results, and the retractable Faraday Cup.
Probe Current Meter
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This device measures the absorbed current of the sample, which allows accurate reproduction of results. Provides a liquid crystal display of electron beam probe current.
- 1pA to 2uA in five switched direct ranges
- Can sustain large overloads without damage
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Backscattered Electron Test Specimen
This Test Sample is produced so that performance of Backscattered Detectors may be verified. In addition, the test sample includes 4 adjacent elemental pairs evenly spaced with atomic number differences of 1Z. These may also be used to verify the performance or act as a quantitative references.
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- Checks detector and SEM performance
- Certified samples for system calibration
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"Printerface" Software
This is a direct interface between the older SEMs and computer bring the whole world of computer image processing and archiving directly to the SEM operator.
- Produces low cost micrographs, and allows micrograph archiving
- Micrographs obtained can be pasted directly into a number of standard publishing or graphics software packages, so that you can create professional presentations
- SEM to printer interface
- Captures high resolution images
- Updates older SEMs.
Specimen Temperature Control
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Ideal for use with the environmental or variable pressure SEM, this device heats or cools the sample whilst it is in the chamber, including fragile specimens which require cooling to slow the evaporation of water into the chamber vacuum. Features include:
- Stable control of specimen temperature
- Operation between -30°C and°+50°C
Short settling time |
Specimen Current-EBIC Amplifier
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This device is designed to operate with the small currents absorbed by the sample in the SEM. It gives accurate absorbed current measurements, but will also provide images over a wide range of probe currents. At higher probe currents TV rate images are possible and at slow scan, low noise images can be produced. |
STEM Grid Holder
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This is designed to carry up to 8 standard 3.05mm TEM grids for analysis in the SEM. It fits to any standard “Cambridge”or "Hitachi" type specimen holder. It can be provided with an adapter to fit other styles if required. |
I.C. Test Sockets
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I.C. Test Sockets are widely used in the semiconductor industry for examination of integrated circuits and other semiconductor devices in the SEM. In particular they are used in failure analysis and EBIC studies.
- ZIF Socket with multiple pin leadouts
- Simple to install
Easy to load and change |
Mounting/Flange Vacuum Feedthrough Plates
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Specialist vacuum feedthroughs are used for a wide variety of applications in the SEM. Either as a direct replacement for an existing damaged plate or to allow more flexibility in the range and amount of accessories that can be fitted and/or used in the chamber at any one time.
- Available for most SEM's
- Huge range available
Built to customer specification |
Please e-mail us for further information on any of these products. |
